on 25 Apr 2016
Last Applicant/ Owned by
CyberOptics Corporation
5900 Golden Hills Drive Golden Valley MN 55416
, ,
Serial Number
UK00801302623 filed on 25th Apr 2016
Registration Number
UK00801302623 registered on
20th Dec 2016
Correspondent Information
Bristows LLP
100 Victoria Embankment
London,
EC4Y 0DH
Optical, laser and machine vision sensors, cameras, detectors, computer hardware, and software for measuring 2d and 3d dimensions, surface roughness, texture, and spectral color; sensors, detectors, computer hardware, and software for measuring or detecting environmental parameters in the nature of humidity, gas, airborne particles, vibration and temperature; optical, laser and machine vision sensors, cameras, detectors, computer hardware, and software for solder paste inspection, and automated optical inspection of circuit board assemblies; optical, laser and machine vision sensors, cameras, detectors, computer hardware, and software for dimensional metrology measurement and detection of objects, including contour, shape, thickness, waviness, warpage, angle, radius, diameter and height of such objects; optical, laser and machine vision sensors, cameras, detectors, computer hardware, and software for control of electronic assembly manufacturing processes; optical, laser and machine vision sensors, cameras, detectors, computer hardware, and software for detection and classification of object features; optical, laser and machine vision sensors, cameras, computer hardware, and software for inspection of back-end semiconductor packaging; optical, laser and machine vision sensors, cameras, computer hardware, and software for robotic guidance for the pick and placement of components on circuit board assemblies, ranging, collision avoidance, environment mapping and surgical assistance; optical, laser and machine vision sensors, cameras, detectors, computer hardware, and software for reverse engineering, scanning and digitizing of objects; sensors, detectors, computer hardware, and software that enables semiconductor tool setup and maintenance of the tool resulting in improved semiconductor manufacturing efficiencies, yields and quality; sensors, cameras, detectors, computer hardware, and software for detecting and mapping the location of semiconductor wafers; and machine vision systems comprising sensors, computer hardware and software.
UK00801302623
Word
Individual